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LT-evo
Worldwide No.1 high speed UENO flagship turret handler
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LT36
Max. 16-parallel testing High productivity with long test time
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LT-Hot
High speed turret handler with high temperature test
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RT
Pick-up handler for a 12, 8, 6 inch wafer integrated vision, test, and laser marking
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RT-Tray
Wafer input, Tray output with 6-side vision
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RT-Wafer
Wafer input, Wafer reconstruction with 6-side vision Transparent parts such as an optical device can be inspected
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RS-evo
High speed pick-up handler for a 12, 8, 6 inch wafer with integrated vision, test, and laser marking
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RST
Changeover free high speed pick up handler for high mix flexible production
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RV-evo
High speed die sorter with vision inspection for WLCSP, bare-dies, discrete, and passive devices
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TS-evo
Easy changeover Flexible pick up die sorter and handler
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WS-evo
12” wafer ring to 12” wafer ring high speed reconstruction machine with vision inspection for WLCSP, KGD(Known Good Die), and image sensor on a 12” wafer.
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RP124
Wafer ring to wafer ring replacing machine with vision inspection for WLCSP, KGD(Known Good Die), and WLCSP-LED
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RV320
Wafer to Tape & Reel for non-flip WLCSP and WLCSP-LED with integrated testing
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RHR-evo
Wafer input Room temp.→ High temp.→ Room temp. test handler
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LV-evo
Higher speed Tray to Tray machine with 6-side vision
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TR-Tray
High speed tray to tray machine with vision inspection No time loss of tray change
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TR-Tape
High speed tray to tape & reel machine with vision inspection No time loss of tray change
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